Showing 13–24 of 27 results

• 

  Nikon Microscope w/ Irvine Optical Ultrastation

  4770

  Manufacturer:

  Nikon

  Model:

  Max Wafer:

  ID #:

  4770

  Configuration:

  Auto Handler Included! 

  View Details Request For Quote
• 

  Rudolph NSX-115 Advanced Wafer Inspection

  4768

  Manufacturer:

  Rudolph

  Model:

  NSX-115

  Max Wafer:

  ID #:

  4768

  Configuration:

  Advanced Wafer Inspection 

  View Details Request For Quote
• 

  Rudolph / August NSX-105 Automated Wafer, Die & Bump Inspection

  4767

  Manufacturer:

  Rudolph / August

  Model:

  NSX-105d1

  Max Wafer:

  ID #:

  4767

  Configuration:

  Automated  Wafer, Die & Bump Inspection! 

  View Details Request For Quote
• 

  Rudolph NSX-105d1 Automated Wafer, Die & Bump Inspection

  4766

  Manufacturer:

  Rudolph

  Model:

  NSX-105d1

  Max Wafer:

  ID #:

  4766

  Configuration:

  Automated  Wafer, Die & Bump Inspection! 

  View Details Request For Quote
• 

  Rudolph / August NSX-95 Defect Inspection System

  4765

  Manufacturer:

  Rudolph / August

  Model:

  NSX-95

  Max Wafer:

  ID #:

  4765

  Configuration:

  View Details Request For Quote
• 

  Rudolph / August NSX-95 Automated Defect Inspection

  4763

  Manufacturer:

  Rudolph / August

  Model:

  NSX-95

  Max Wafer:

  ID #:

  4763

  Configuration:

  Automated Wafer Handling! 

  View Details Request For Quote
• 

  KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting

  4753

  Manufacturer:

  KLA-Tencor

  Model:

  AIT I

  Max Wafer:

  200mm

  ID #:

  4753

  Configuration:

  6"/150mm & 8"/200mm Wafers, Auto Focus, Double Darkfield Inspection

  View Details Request For Quote
• 

  KLA-Tencor P-10 Surface Profiler

  4712

  Manufacturer:

  KLA-Tencor

  Model:

  P-10 Surface Profiler

  Max Wafer:

  200mm

  ID #:

  4712

  Configuration:

  8"/200mm Wafer Capable, Calibrated to P-10 Specifications

  View Details Request For Quote
• 

  KLA-Tencor 5200XP Overlay Registration System

  4710

  Manufacturer:

  KLA-Tencor

  Model:

  5200XP Overlay Registration System

  Max Wafer:

  200mm

  ID #:

  4710

  Configuration:

  View Details Request For Quote
• 

  KLA-Tencor Prometrix UV-1050 Thin Film Measurement System

  4579

  Manufacturer:

  KLA-Tencor

  Model:

  UV-1050

  Max Wafer:

  ID #:

  4579

  Configuration:

  150mm-200mm Wafers, Measures Film Thickness, 2 Open Cassette Stations

  View Details Request For Quote
• 

  KLA-Tencor P-11 Long Scan Profiler

  4532

  Manufacturer:

  KLA-Tencor

  Model:

  P-11 Profiler

  Max Wafer:

  ID #:

  4532

  Configuration:

  Calibrated to OEM specifications, up to 8"/200mm wafer capable

  View Details Request For Quote
• 

  KLA Tencor P-1 Profiler

  4492

  Manufacturer:

  KLA Tencor

  Model:

  P-1

  Max Wafer:

  ID #:

  4492

  Configuration:

  View Details Request For Quote