KLA-TENCOR P-11 PROFILER consisting of:
 
- Model:  P-11 Profiler (converted from P-12)
- Up to 8"/200mm wafer capable
- Computer controlled
- Measures roughness, waviness, step height, and other surface characteristics
- Automatic measurement capability
- Measurement of vertical features ranging from under 100Å (0.4 min.) to approximately 300 µm (11 mils), with a vertical resolution of 0.5, 2, or 10Å.
- Photo-realistic rendering of the scan data in three dimensions for extended surface analysis.
- A virtually unlimited number of data points per profile guarantee that the horizontal resolution is limited by the stylus radius and not by the number of data points.
- Measurement of many roughness and waviness parameters, with user-selectable cutoff filters to isolate roughness and waviness.
- Ability to fit and level a scan, allowing accurate step height measurements on curved surfaces.
- Ability to detect the edge or apex of a profile feature, allowing automated data analysis relative to the feature.
- Ability to repeat a scan up to ten times and automatically calculate the average, thereby minimizing the effects of environmental noise on measurements.
- Available for Full Inspection and Demonstration!
- 6 Months Warranty on Parts and Labor (Stylus is not covered under warranty) 
 
KLA-Tencor P-11 can profile a variety of materials including:
 
- Semiconductor wafers
- Thin-film heads
- Precision-machined and polished surfaces
- Ceramics for micro-electronics
- Glass for flat panel displays
- Optical surfaces

Excellent Condition Guaranteed.
Fully Reconditioned to Factory Specifications by ClassOne.
6 Month Warranty and Full Specifications Guarantee.
30 Day Right of Return. 

As-Is / Where-Is Pricing is Also Available.