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Showing 1–12 of 29 results
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KLA-Tencor P-16+OF Surface Profiler
5014
Manufacturer:
KLA-Tencor
Model:
P-16+OF Surface Profiler
Max Wafer:
300mm
ID #:
5014
Configuration:
View Details
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CDE ResMap 273 Resistivity Mapping System
4994
Manufacturer:
CDE
Model:
ResMap 273
Max Wafer:
300mm
ID #:
4994
Configuration:
300mm Capable, Small Footprint!
View Details
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AUROS OL-100N Overlay Measurement Tool
4992
Manufacturer:
AUROS
Model:
OL-100N
Max Wafer:
ID #:
4992
Configuration:
View Details
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KLA-Tencor P-10 Surface Profiler
4984
Manufacturer:
KLA-Tencor
Model:
P-10 Surface Profiler
Max Wafer:
200mm
ID #:
4984
Configuration:
8"/200mm Wafer Capable, Calibrated to P-10 Specifications
View Details
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Asyst ALU 2150 SMIF Loading Port Rev W Part 9700-2404-11
4979
Manufacturer:
ASYST
Model:
ALU 2150
Max Wafer:
ID #:
4979
Configuration:
View Details
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Nanometrics RpmBlue FX Spectral Metrology System
4964
Manufacturer:
Nanometrics
Model:
RpmBlue FX
Max Wafer:
ID #:
4964
Configuration:
View Details
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Rudolph NSX 330 Metrology System
4962
Manufacturer:
Rudolph
Model:
NSX 330
Max Wafer:
ID #:
4962
Configuration:
View Details
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Nikon Eclipse L200N Microscope
4959
Manufacturer:
Nikon
Model:
Eclipse L200N
Max Wafer:
ID #:
4959
Configuration:
View Details
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KLA-Tencor AIT I Patterned Surface Defect Inspection System
4933
Manufacturer:
KLA-Tencor
Model:
AIT I
Max Wafer:
200mm
ID #:
4933
Configuration:
6"/150mm & 8"/200mm Wafers, Auto Focus, Double Darkfield Inspection
View Details
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Nikon Eclipse L200 Microscope
4907
Manufacturer:
Nikon
Model:
Eclipse L200
Max Wafer:
ID #:
4907
Configuration:
View Details
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August Robot Wafer Handler Model QA-MDI-02
4901
Manufacturer:
August
Model:
QA-MDI-02
Max Wafer:
ID #:
4901
Configuration:
View Details
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Veeco Wyko NT3300 Profiler
4821
Manufacturer:
Veeco Wyko
Model:
NT3300
Max Wafer:
ID #:
4821
Configuration:
View Details
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