Showing 1–12 of 16 results

• 

  KLA-Tencor P-10 Surface Profiler

  4584

  Manufacturer:

  KLA-Tencor

  Model:

  P-10 Surface Profiler

  Max Wafer:

  200mm

  ID #:

  4584

  Configuration:

  8"/200mm Wafer Capable, Calibrated to P-10 Specifications

  View Details Request For Quote
• 

  KLA-Tencor Prometrix UV-1050 Thin Film Measurement System

  4579

  Manufacturer:

  KLA-Tencor

  Model:

  UV-1050

  Max Wafer:

  ID #:

  4579

  Configuration:

  150mm-200mm Wafers, Measures Film Thickness, 2 Open Cassette Stations

  View Details Request For Quote
• 

  Veeco Dimensions 3100 AFM

  4573

  Manufacturer:

  Veeco

  Model:

  Dimension 3100 AFM

  Max Wafer:

  150mm

  ID #:

  4573

  Configuration:

  View Details Request For Quote
• 

  KLA-Tencor AIT I Patterned Surface Defect Inspection System

  4559

  Manufacturer:

  KLA-Tencor

  Model:

  AIT I

  Max Wafer:

  150mm

  ID #:

  4559

  Configuration:

  6"/150mm & 8"/200mm Wafers, Auto Focus, Double Darkfield Inspection

  View Details Request For Quote
• 

  KLA-Tencor P-11 Long Scan Profiler

  4532

  Manufacturer:

  KLA-Tencor

  Model:

  P-11 Profiler

  Max Wafer:

  ID #:

  4532

  Configuration:

  Calibrated to OEM specifications, up to 8"/200mm wafer capable

  View Details Request For Quote
• 

  Caltex Systems Microscope

  4501

  Manufacturer:

  Caltex

  Model:

  AMS-845xyz

  Max Wafer:

  ID #:

  4501

  Configuration:

  View Details Request For Quote
• 

  Veeco Instruments Dektak 3030 Profiler

  4494

  Manufacturer:

  Veeco Instruments

  Model:

  Dektak 3030

  Max Wafer:

  ID #:

  4494

  Configuration:

  View Details Request For Quote
• 

  KLA Tencor P-1 Profiler

  4492

  Manufacturer:

  KLA Tencor

  Model:

  P-1

  Max Wafer:

  ID #:

  4492

  Configuration:

  View Details Request For Quote
• 

  KLA-Tencor Alpha-Step 200 Surface Profiler

  4490

  Manufacturer:

  KLA Tencor

  Model:

  Max Wafer:

  150mm

  ID #:

  4490

  Configuration:

  6"/150mm Chuck, Stylus-Based Surface Profilometer

  View Details Request For Quote
• 

  Jeol JSM-6400F Scanning Microscope

  4488

  Manufacturer:

  Jeol

  Model:

  JSM-6400F

  Max Wafer:

  ID #:

  4488

  Configuration:

  Resolution: 1.5 nm at 30 kV and at 8mm WD; Magnification: 10X to 500,000X

  View Details Request For Quote
• 

  Coating Management Instruments (CMI) XRX-X4 X-Ray System

  4073

  Manufacturer:

  Model:

  Max Wafer:

  ID #:

  4073

  Configuration:

  Coating Management Instruments (CMI) XRX-X4 X-Ray System

  View Details Request For Quote
• 

  KLA-Tencor 5100 Overlay Registration System

  3801

  Manufacturer:

  KLA-Tencor

  Model:

  5100 Overlay Registration System

  Max Wafer:

  200mm

  ID #:

  3801

  Configuration:

  KLA-Tencor 5100 Overlay Registration System

  View Details Request For Quote