Used Wafer Inspection Equipment

Defect detection is critical, as is precision and reliability in your wafer analysis and wafer inspection equipment. When you are using used wafer inspection equipment, knowing that it’s completely reliable and accurate is even more critical. That’s why we offer the best in refurbished equipment that we have personally reviewed and vetted.

ClassOne Equipment is the leader in the sell of used and refurbished wafer inspection equipment including wafer sorting systems, visual inspection stations, resistivity mapping systems and ellipsometers. We carry a wide range of wafer analysis and wafer mask inspection equipment and parts that are refurbished to factory standards.

We carry a wide variety of KLA models including: 6200, 6420, 4000, 6220, 2138XP, 4000, 5000 and AIT.

Showing 1–12 of 24 results

Takano Altax 300ex Micro Bump Whole Surface Inspection System
5039

Manufacturer:

Takano

Model:

Altax 300ex

Max Wafer:

300mm

ID #:

5039

Configuration:

Unparalleled inspection speed contributes to increased production capacity!

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Takano Vi-5301 M Patterned Wafer Visual Inspection System
5038

Manufacturer:

Takano

Model:

Vi-5301 M

Max Wafer:

300mm

ID #:

5038

Configuration:

Applications for CMOS Image Sensor, Power Devices, RF Filter, MEMS, Glass, TAIKO WaferHigh reliability based on proven resultsVarious proprietary algorithms to reduce false defectsApplicable on wafers, tape frames, thinned wafers, TAIKO wafers, and glass substratesInner crack detection function after dicingAuto recipe functionAI ADC (AI Auto Defect Classification)Unevenness processing function to separate killer defects from substrate

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Takano Vi-4307 M/C Patterned Wafer Visual Inspection System
5037

Manufacturer:

Takano

Model:

Vi-4307 M/C

Max Wafer:

300mm

ID #:

5037

Configuration:

Applications for CMOS Image Sensor, Power Devices, RF Filter, MEMS, Glass, TAIKO WaferHigh reliability based on proven resultsVarious proprietary algorithms to reduce false defectsApplicable on wafers, tape frames, thinned wafers, TAIKO wafers, and glass substratesInner crack detection function after dicingAuto recipe functionAI ADC (AI Auto Defect Classification)Unevenness processing function to separate killer defects from substrate

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Takano Vi-4207 R/C Patterned Wafer Visual Inspection System
5036

Manufacturer:

Takano

Model:

Vi-4207 R/C

Max Wafer:

200mm

ID #:

5036

Configuration:

Applications for CMOS Image Sensor, Power Devices, RF Filter, MEMS, Glass, TAIKO WaferHigh reliability based on proven resultsVarious proprietary algorithms to reduce false defectsApplicable on wafers, tape frames, thinned wafers, TAIKO wafers, and glass substratesInner crack detection function after dicingAuto recipe functionAI ADC (AI Auto Defect Classification)Unevenness processing function to separate killer defects from substrate

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*NEW* Takano WM-10 Surface Particle Inspection System
4618

Manufacturer:

Takano

Model:

WM-10 Particle Inspection System

Max Wafer:

300mm

ID #:

4618

Configuration:

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*NEW* Takano WM-7SR Surface Particle Inspection System
4617

Manufacturer:

Takano

Model:

WM-7SR Particle Inspection System

Max Wafer:

200mm

ID #:

4617

Configuration:

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Nanotronics Nspec PS Defect Inspection System
5071

Manufacturer:

Nanotronics

Model:

Nspec PS

Max Wafer:

200mm

ID #:

5071

Configuration:

Nanotronics Nspec PS, Aluminum Vacuum Chuck, 100, 150, and 200mm Capable

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KLA-Tencor Surfscan SP1 DLS Unpatterned Surface Inspection System
5069

Manufacturer:

KLA-Tencor

Model:

SP1 DLS

Max Wafer:

300mm

ID #:

5069

Configuration:

Configured for 300mm Wafers, Puck/Vacuum, Open Cassette or Dual FOUP/FIMS Handler200mm/300mm, Puck/Vacuum, Open Cassette or FIM/FOUP HandlerALTERNATIVELY, check out our BRAND NEW WM-10 Takano Surface Particle Inspection Systems: var blink = document.getElementById('blink'); setInterval(function () { blink.style.opacity = (blink.style.opacity == 0 ? 1 : 0);}, 1000); https://classoneequipment.com/product/takano-wm-10-surfsace-particle-inspection-system/">https://classoneequipment.com/product/takano-wm-10-surfsace-particle-inspection-system/

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KLA Tencor Surfscan 6200 Particle Inspection System
5057

Manufacturer:

KLA-Tencor

Model:

Surfscan 6200

Max Wafer:

200mm

ID #:

5057

Configuration:

200mm Wafers, New Laser, Optics Aligned, New Power Supply, Calibrated to OEM Specs

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Takano WM-10R Surface Particle Inspection System
4974

Manufacturer:

Takano

Model:

WM-10R Particle Inspection System

Max Wafer:

300mm

ID #:

4974

Configuration:

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KLA-Tencor Archer 10 Overlay Registration Measurement System
4499

Manufacturer:

KLA-Tencor

Model:

Archer 10

Max Wafer:

200mm

ID #:

4499

Configuration:

Overlay Registration, Fully Automated, 200mm Wafers

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KLA-Tencor AIT I Patterned Surface Defect Inspection System
4933

Manufacturer:

KLA-Tencor

Model:

AIT I

Max Wafer:

200mm

ID #:

4933

Configuration:

6"/150mm & 8"/200mm Wafers, Auto Focus, Double Darkfield Inspection

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