Takano Vi-4307 M/C Patterned Wafer Visual Inspection System
5037
Manufacturer:
Takano
Model:
Vi-4307 M/C
Max Wafer:
300mm
ID #:
5037
Configuration:
Applications for CMOS Image Sensor, Power Devices, RF Filter, MEMS, Glass, TAIKO WaferHigh reliability based on proven resultsVarious proprietary algorithms to reduce false defectsApplicable on wafers, tape frames, thinned wafers, TAIKO wafers, and glass substratesInner crack detection function after dicingAuto recipe functionAI ADC (AI Auto Defect Classification)Unevenness processing function to separate killer defects from substrate
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