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Home › Semiconductor Metrology Equipment

	Thin Film Measurement Equipment › Used and Refurbished KLA-Tencor, Prometrix, ThermaWave, Rudolph, and other Thin Film Measurement Equipment.
	Surface Metrology Equipment › Used and Refurbished Surface Profilers, Stress Measurement, Resistivity Measurement, and other Surface Metrology Tools.
	Defect Inspection Equipment › Used and Refurbished KLA-Tencor Surfscan, KLA 21xx Series, KLA AIT Series, and other Defect Inspection Equipment.
	Scanning Electron Microscopes › Used and Refurbished Hitachi, JEOL, Zeiss, and FEI Scanning Electron Microscopes (SEMs).
	Inspection Microscopes  › Used and Refurbished Zeiss, Olympus, Nikon, Leica, and Reichert Inspection Microscopes.
	Stereozoom Microscopes › Used and Refurbished Stereozoom Microscopes from Olympus, Nikon, Leica, and Wild.
	Probe Stations › Used and Refurbished Karl Suss, Cascade, and Signatone Probe Stations including Manual, Semi-Auto, and fully Automatic Probe Stations.

Refurbishing Process › Suss Mask Aligners › Nanospec Series › Logitech Polishers › Semitool & Verteq SRDs › Wet Process Benches

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