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Home ›  Metrology Equipment › Defect Inspection Equipment

Defect Inspection Equipment

	Manufacturer	Model	Configuration	Price
	ADE	9500 Ultra Guage Multimeasurement System	ADE 9500 Ultra Guage Multimeasurement System	CALL
	ADE	9600 High Speed Measurement and Sorting System	ADE 9600 Ultrascan High Speed Measurement and Sorting System	CALL
	ADE	9700 Ultra Guage Multimeasurement System	ADE 9700 Ultra Guage Multimeasurement System	CALL
	KLA-Tencor	2135 Wafer Inspection System	Setup for 200mm wafers, SECS II/GEM Interface, Refurbished to specifications (M1189)	CALL
	KLA-Tencor	2138/2139 Brightfield Defect Inspection System	KLA-Tencor 2138/2139 Brightfield Defect Inspection System	CALL
	KLA-Tencor	2351 Brightfield Defect Inspection System	KLA-Tencor 2351 Brightfield Defect Inspection System	CALL
	KLA-Tencor	2401 Viper Macro Defect Inspection System	KLA-Tencor 2401 Viper Macro Defect Inspection System	CALL
	KLA-Tencor	301, SL351, SL300 Reticle Inspection Systems	KLA-Tencor 301, SL351, SL300 Reticle Inspection Systems	CALL
	KLA-Tencor	5200 Overlay Registration System	KLA-Tencor 5200 Overlay Registration System	CALL
	KLA-Tencor	AIT 2 Darkfield Defect Inspection System	KLA-Tencor AIT 2 Darkfield Defect Inspection System	CALL
	KLA-Tencor	AIT I Defect Inspection System	Patterned Surface Defect Inspection System, Auto Focus, 8""/200mm wafers	CALL
	KLA-Tencor	AIT XP+ Darkfield Defect Inspection System	KLA-Tencor AIT XP+ Darkfield Defect Inspection System	CALL
	KLA-Tencor	AIT XP+ Darkfield Inspection System	AIT XP+ Darkfield Inspection System	CALL
	KLA-Tencor	Archer Overlay Registration System	KLA-Tencor Archer Overlay Registration System	CALL
	KLA-Tencor	SP1 Classic	KLA-Tencor Surfscan SP1 Classic Wafer Surface Analysis System	CALL
	KLA-Tencor	Surfscan 4000	Unpatterned Wafer Surface Inspection Tool, up to 6”/150mm capable	CALL
	KLA-Tencor	Surfscan 4000	Unpatterned Wafer Surface Inspection Tool, up to 6”/150mm capable	CALL
	KLA-Tencor	Surfscan 4500	Unpatterned Wafer Surface Inspection Tool, up to 6”/150mm capable	CALL
	KLA-Tencor	Surfscan 5000	Unpatterned Wafer Surface Inspection Tool, up to 8”/200mm capable	CALL
	KLA-Tencor	Surfscan 5500	Unpatterned Wafer Surface Inspection Tool, up to 8”/200mm capable	CALL
	KLA-Tencor	Surfscan 5500	Unpatterned Wafer Surface Inspection Tool, up to 8”/200mm capable	CALL
	KLA-Tencor	Surfscan 6200	Unpatterned Surface Inspection System, up to 200mm capable (M1046)	CALL
	KLA-Tencor	Surfscan 6220	New Laser, New Power Supply, Calibrated to OEM specifications, up to 8""/200mm wafer capable	CALL
	KLA-Tencor	Surfscan 6400	New Laser, New Power Supply, Calibrated to OEM specifications, up to 8""/200mm wafer capable	CALL
	KLA-Tencor	Surfscan 6400	Unpatterned Surface Inspection System, up to 200mm capable (M1037)	CALL
	KLA-Tencor	Surfscan 6420	New Laser, New Power Supply, Calibrated to OEM specifications, up to 8""/200mm wafer capable	CALL
	KLA-Tencor	Surfscan 6420	New Laser, New Power Supply, Calibrated to OEM specifications, up to 8""/200mm wafer capable	CALL
	KLA-Tencor	Surfscan 7600/7700 Defect Inspection System	Surfscan 7600/7700 Defect Inspection System	CALL
	KLA-Tencor	Surfscan SP1 Classic	KLA-Tencor SPI Classic Wafer Surface Analysis System	CALL
	KLA-Tencor	Surfscan SP1 DLS System	SP1 DLS Wafer Surface Analysis System	CALL
	KLA-Tencor	Surfscan SP1 TBI	Surfscan SP1 TBI, Puck/Vacuum, Open Handler, Refurbished to OEM Spec	CALL
	Leica	INS-1000 Wafer Inspection Microscope	INS-1000 Wafer Inspection Microscope Parts System (1531)	CALL
	Nikon	Optistation 3A	Automated Inspection Station, 8""/200mm wafers, 2.5x-150x Objectives	CALL
	Nikon	Optistation 3A	Automated Inspection Station, 8""/200mm wafers, 2.5x-150x Objectives (1348)	CALL
	RECIF	IDLW8 Wafer ID Reader	Optical Wafer ID Reader, contact free, up to 8""/200mm wafers	CALL
	RECIF	IDLW8 Wafer ID Reader	Optical Wafer ID Reader, contact free, up to 8""/200mm wafers	CALL