Nanotronics nSpec 2

Surface Metrology
Model:
Nanotronics nSpec 2 for sale
Price:
Request Price Quote     ID#:  4435
Picture:
Optical Defect Inspection System, Fully Automated, Up to 200m Wafers
photo
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Details:

NANOTRONICS NSPEC 2 OPTICAL DEFECT INSPECTION SYSTEM consisting of:

- Model: nSpec 2
- Advanced Automatic Optical Inspection System
- For use with Bare substrates, Epi wafers, Patterned wafers, Diced Wafers and Individual Devices
- Features AI Analyzer: an Intelligent, Automatic Defect Detection and Classification System
- Multiple inspection modes with flexible defect detection algorithms and high throughput
- Stage:
• Capable of up to 200mm Wafers
• Travel: 200 mm X and Y Direction
• Fully Automated (25 Wafers / Cassette)
• Repeatability: +/- 5 um
• Step Size: 0.04 um
• Travel Flatness: 30 um
- Imaging Optics:
• White Light Illumination: LED (other options available)
• Camera Image Size: 6 MP or Greater
• Maximum Frame Rate: 17.4 fps
• 5x, 10x, 20x or 50x Brightfield / Darkfield Objective
• DIC (Nomarski)
- Computer, Mouse, Keyboard
- Customizable Defect Reports
- AFM Nanometer-Resolution Scanning Probe Available (optional)
- Brand New w/ 12 Month Manufacturer''s Warranty & Support

Condition:

Brand New w/ 12 Month Manufacturer''s Warranty & Support


Delivery:

8-10 weeks

Price:
      ID#:  4435