Nanometrics Nanospec 8300

Film Thickness Measurement
Model:
Nanometrics Nanospec 8300 for sale
Price:
Request Price Quote     ID#:  2837
Picture:
 200mm and 300mm Wafer Capable, Automatic Thin Film Analysis via Spectroscopic Ellipsometry
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Details:

NANOMETRICS NANOSPEC 8300 FILM THICKNESS MEASUREMENT SYSTEM consisting of:
 
- Model: Nanospec 8300
- Wafer Size: 200mm and 300mm wafers
- Automatic film thickness measurement system
- Thin film analysis via Spectroscopic Ellipsometry, UV Reflectometry, and Visible Reflectometry
- Sophisticated modeling algorithms for the determination of optical constants and film thickness
- Multi-tasking capability for high throughput and low Cost-of-Ownership
- Comprehensive data analysis via mapping and SPC software packages
- Spectroscopic Ellipsometer
- New style TRI-CCD standalone Pre-Aligner for better accuracy than IR
 
Nanospec 8300 Data Analysis Capabilities:
 
- Mapping Die, contour, 2 and 3 dimensional color, and differential
- Stage Scanning Line scan and diameter scan
- SPC software Trend charts and histograms
- Database Spreadsheet compatible
 

 

Condition:

Excellent Condition Guaranteed.
Fully Refurbished to Factory Specifications by ClassOne. 
Available 3 Month Warranty
30 Day Right of Return.


Delivery:

4-6 Weeks

Price:
      ID#:  2837